Ujjwal Guin

Ujjwal Guin is a Godbold Associate Professor in the Department of Electrical and Computer Engineering at Auburn University. He received his Ph.D. from the University of Connecticut in 2016. He is actively engaged in research projects spanning hardware security and trust, supply chain security, cybersecurity, and VLSI design and testing. He has developed several on-chip structures and techniques to enhance the security, trustworthiness, and reliability of integrated circuits. His contributions include authoring one book, two book chapters, thirty journal articles, and more than forty refereed conference papers. His research has been widely recognized through best paper nominations, awards, research grants, and prizes from various security competitions. Notably, one of his papers was referenced in the White House 100-Day Reviews under the EO 14017 report, specifically in the “Building Resilient Supply Chains” section, published in June 2021. Dr. Guin’s research projects are funded by the U.S. Army, the Air Force Office of Scientific Research (AFOSR), the Secret Service, the National Science Foundation (NSF), and the Air Force Research Laboratory (AFRL). He served on the technical program committees of several prestigious conferences, including DAC, ITC, HOST, VTS, PAINE, VLSID, GLSVLSI, ISVLSI, and Blockchain. He is currently the Technical Program Co-Chair of HOST 2025. He is a Senior Member of IEEE and ACM.